NX-DP-GAN039-TSC

NX-DP-GAN039-TSC is a half-bridge evaluation board that enables double-pulse testing of GaN FETs in a top-side cooled copper-clip package (CCPAK). It is optimized for low inductance and features on-board current sensing capability to support typical switching performance evaluation such as switching losses Esw, voltage- and current slopes, reverse-recovery Qr or gate drive performance directly out of the box. The evaluation board can be configured to support both thermal resistance analysis as well as continuous half-bridge converter operation in buck- or boost mode. At a DC input voltage of up to 450V, output power of up to 5KW at a switching frequency of 100KHz can be achieved when paired with a suitable high-power inductor.